Yoshihisa SOUTOME


Circuit Simulation Study for Characterization of High-Temperature Superconducting Sigma-Delta Modulator with 100 GHz Sampling
Kazuo SAITOH Futoshi FURUTA Yoshihisa SOUTOME Tokuumi FUKAZAWA Kazumasa TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/01/01
Vol. E86-C  No. 1  pp. 24-29
Type of Manuscript:  INVITED PAPER (Special Issue on Superconductor Digital/Analog Circuit Technologies)
Category: HTS Digital Applications
Keyword: 
single flux quantuminterface-engineered Josephson junctionsuperconducting sigma-delta modulator
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HTS Surface-Modified Junctions with Integrated Ground-Planes for SFQ Circuits
Yoshihisa SOUTOME Tokuumi FUKAZAWA Kazuo SAITOH Akira TSUKAMOTO Kazumasa TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/03/01
Vol. E85-C  No. 3  pp. 759-763
Type of Manuscript:  INVITED PAPER (Special Issue on Superconductive Electronics)
Category: Junctions and Processing
Keyword: 
high-temperature-superconductorJosephson junctionSFQ circuitramp-edge junctiongroundplane
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Characterization of YBa2Cu3O7-x Co-planar Josephson Junctions Using Focused Ion Beam
Yoshihisa SOUTOME Hidehiro SHIGA Yoichi OKABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/10/25
Vol. E81-C  No. 10  pp. 1538-1543
Type of Manuscript:  INVITED PAPER (Special Issue on Low- and High-Temperature Superconductive Electron Devices and Their Applications)
Category: High-Tc Junction Technology
Keyword: 
focused ion beamco-planar Josephson junction
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Co-planar Josephson Junction Using Nonsuperconductive YBaCuO Formed on Very Locally Damaged Substrate by FIB
Yunnghee KIM Yoshihisa SOUTOME Hiroshi KIMURA Yoichi OKABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/05/25
Vol. E78-C  No. 5  pp. 471-475
Type of Manuscript:  Special Section PAPER (Special Issue on Superconducting Electronics and Its Applications)
Category: Three terminal devices and Josephson Junctions
Keyword: 
YBaCuOJosephson junctionPlanar junctionShapiro stepsFocused Ion Beam
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