Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C
No. 4
pp. 453-459
Type of Manuscript:
Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category:
Keyword:
DDR interface, SoC, round-trip-time, loop-backed test, |