Yoshiharu TOSAKA


Theoretical Study of Alpha-Particle-lnduced Soft Errors in Submicron SOI SRAM
Yoshiharu TOSAKA Kunihiro SUZUKI Shigeo SATOH Toshihiro SUGII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/06/25
Vol. E79-C  No. 6  pp. 767-771
Type of Manuscript:  Special Section PAPER (Special Issue on ULSI Memory Technology)
Category: Static RAMs
Keyword: 
soft errorsSOI SRAM, α-particle-induced bipolar currentcritical α-particle-induced initial chargesoft error rate
 Summary | Full Text:PDF

High-Speed and Low-Power n+-p+ Double-Gate SOI CMOS
Kunihiro SUZUKI Tetsu TANAKA Yoshiharu TOSAKA Hiroshi HORIE Toshihiro SUGII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/04/25
Vol. E78-C  No. 4  pp. 360-367
Type of Manuscript:  Special Section PAPER (Special Issue on Low-Voltage, Low-Power Integrated Circuits)
Category: Device Technology
Keyword: 
MOSFETSOIdouble-gatehigh-speedlow-powerthreshold voltage
 Summary | Full Text:PDF