Yoshifumi ZOKA


Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model
Kenshiro SATO Dondee NAVARRO Shinya SEKIZAKI Yoshifumi ZOKA Naoto YORINO Hans Jürgen MATTAUSCH Mitiko MIURA-MATTAUSCH 
Publication:   
Publication Date: 2020/03/01
Vol. E103-C  No. 3  pp. 119-126
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
compact modelDC-AC converterdevice agingefficiencySiC-MOSFET
 Summary | Full Text:PDF

Efficiency Analysis of SiC-MOSFET-Based Bidirectional Isolated DC/DC Converters
Atsushi SAITO Kenshiro SATO Yuta TANIMOTO Kai MATSUURA Yutaka SASAKI Mitiko MIURA-MATTAUSCH Hans Jürgen MATTAUSCH Yoshifumi ZOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/09/01
Vol. E99-C  No. 9  pp. 1065-1070
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
circuit simulationcompact modelDC/DC converterSiC-MOSFEToptimizationconversion efficiency
 Summary | Full Text:PDF