Yong-Chun KIM


A DFT Controller for Instruction-Based Functional Test
Hong-Sik KIM Yong-Chun KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/08/01
Vol. E84-A  No. 8  pp. 2070-2072
Type of Manuscript:  LETTER
Category: VLSI Design Technology and CAD
Keyword: 
functional testscan
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