Yoichi AKASAKA


The Impact Ionization Calculated by Monte Carlo Technique
Masayoshi SHIRAHATA Norihiko KOTANI Yoichi AKASAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/06/25
Vol. E74-C  No. 6  pp. 1656-1661
Type of Manuscript:  Special Section PAPER (Special Issue on Device and Process Simulation for Ultra Large Scale Integration)
Category: 
Keyword: 
 Summary | Full Text:PDF(446.5KB)

Oblique Rotating Ion Implantation Simulation for the Drain Formation of Gate/N- Overlapped LDD MOSFET's Using the Monte Carlo Method
Tatsuya KUNIKIYO Masato FUJINAGA Tetsuya UCHIDA Norihiko KOTANI Yoichi AKASAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/06/25
Vol. E74-C  No. 6  pp. 1662-1671
Type of Manuscript:  Special Section PAPER (Special Issue on Device and Process Simulation for Ultra Large Scale Integration)
Category: 
Keyword: 
 Summary | Full Text:PDF(731.8KB)

3-D IC Technologies and Possible Application
Yoichi AKASAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/02/25
Vol. E74-C  No. 2  pp. 325-336
Type of Manuscript:  INVITED PAPER
Category: 
Keyword: 
 Summary | Full Text:PDF(1.1MB)