Yohei TAN


Background Self-Calibration Algorithm for Pipelined ADC Using Split ADC Scheme
Takuya YAGI Kunihiko USUI Tatsuji MATSUURA Satoshi UEMORI Satoshi ITO Yohei TAN Haruo KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/07/01
Vol. E94-C  No. 7  pp. 1233-1236
Type of Manuscript:  BRIEF PAPER
Category: Electronic Circuits
Keyword: 
ADCself-calibrationpipelined ADCsplit ADCdigitally-assisted analog technology
 Summary | Full Text:PDF

Design for Testability That Reduces Linearity Testing Time of SAR ADCs
Tomohiko OGAWA Haruo KOBAYASHI Satoshi UEMORI Yohei TAN Satoshi ITO Nobukazu TAKAI Takahiro J. YAMAGUCHI Kiichi NIITSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6  pp. 1061-1064
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
SAR ADCtestingDC linearitydesign for testabilitybuilt-in self-test
 Summary | Full Text:PDF