Yo-Jen WANG


On the High-Frequency Characteristics and Model of Bulk Effect in RF MOSFETs
Ming-Ta YANG Yo-Jen WANG Patricia Pei-Chen HO Tzu-Jin YEH Darryl Chih-Wei KUO Chin-Wei KUO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 838-844
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
BSIM3bulk effectcompact modelMOSFETsradio frequency
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