Ying-Zu LIN


A Low-Cost Bit-Error-Rate BIST Circuit for High-Speed ADCs Based on Gray Coding
Ya-Ting SHYU Ying-Zu LIN Rong-Sing CHU Guan-Ying HUANG Soon-Jyh CHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A  No. 12  pp. 2415-2423
Type of Manuscript:  PAPER
Category: Analog Signal Processing
Keyword: 
built-in self-test (BIST)bit error rate (BER)analog-to-digital converter (ADC)
 Summary | Full Text:PDF(2.5MB)

A 5-bit 4.2-GS/s Flash ADC in 0.13-µm CMOS Process
Ying-Zu LIN Soon-Jyh CHANG Yen-Ting LIU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/02/01
Vol. E92-C  No. 2  pp. 258-268
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
flash A/D converterhigh-speed data converterinterpolationresistive averaging network
 Summary | Full Text:PDF(1MB)