Yi SHAN


An Unassisted Low-Voltage-Trigger ESD Protection Structure in a 0.18-µm CMOS Process without Extra Process Cost
Bing LI Yi SHAN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/08/01
Vol. E93-C  No. 8  pp. 1359-1364
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
electrostatic discharge (ESD)unassistedlow-voltage-triggertransmission line pulse (TLP)trigger voltagesecond breakdown currentmask
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