Yasuo NAKAGAWA


Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing
Yuichi HAMAMURA Chizu MATSUMOTO Yoshiyuki TSUNODA Koji KAMODA Yoshio IWATA Kenji KANAMITSU Daisuke FUJIKI Fujihiko KOJIKA Hiromi FUJITA Yasuo NAKAGAWA Shun'ichi KANEKO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/01/01
Vol. E92-C  No. 1  pp. 144-152
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
defectsfailure analysisyield estimationintegrated circuit layoutsimulation
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Solder Joint Inspection Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method
Takashi HIROI Kazushi YOSHIMURA Takanori NINOMIYA Toshimitsu HAMADA Yasuo NAKAGAWA Shigeki MIO Kouichi KARASAKI Hideaki SASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/10/25
Vol. E76-D  No. 10  pp. 1144-1152
Type of Manuscript:  Special Section PAPER (Special Section on Machine Vision Applications)
Category: 
Keyword: 
inspection systemsolder jointspeckledefect detecionfluorescence
 Summary | Full Text:PDF

Precise Position Detection of a Mesh-Backed Printing Screen Based on the Smallest Enclosing Circle Detection
Takanori NINOMIYA Yasuo NAKAGAWA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1991/10/25
Vol. E74-D  No. 10  pp. 3484-3491
Type of Manuscript:  Special Section PAPER (Special Issue on Computer Vision and Its Applications)
Category: 
Keyword: 
 Summary | Full Text:PDF