Yasuhiro KATSUMATA


Mechanical Stress Analysis of Trench Isolation Using a Two-Dimensional Simulation
Satoshi MATSUDA Nobuyuki ITOH Chihiro YOSHINO Yoshiroh TSUBOI Yasuhiro KATSUMATA Hiroshi IWAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2  pp. 124-128
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Process Simulation
Keyword: 
trench isolationshallow trenchdeep trenchhigh-speed bipolar LSIsleakage currentmechanical stress
 Summary | Full Text:PDF

Monte Carlo Analysis of Velocity Overshoot Effects in Bipolar Devices with and without an i-Layer
Yoshiroh TSUBOI Claudio FIFGNA Enrico SANGIORGI Bruno RICCÒ Tetsunori WADA Yasuhiro KATSUMATA Hiroshi IWAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2  pp. 174-178
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Device Simulation
Keyword: 
bipolar transistori-layercollector signal delayvelocity overshoot
 Summary | Full Text:PDF