Yasuhide MACHIDA


On-Chip Testing for 30 K-Gate Masterslice
Shinji SATO Hiromasa TAKAHASHI Yasuhide MACHIDA Gensuke GOTO 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1986/04/25
Vol. E69-E  No. 4  pp. 267-269
Type of Manuscript:  Special Section LETTER (Special Issue: Papers from 1986 National Convention IECE Japan)
Category: Silicon Devices and Integrated Circuits
Keyword: 
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