Xiaoying WANG


A Low Power Test Pattern Generator for BIST
Shaochong LEI Feng LIANG Zeye LIU Xiaoying WANG Zhen WANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 696-702
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
built-in self-test (BIST)powersingle input change (SIC)fault coverage
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