Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-ANo. 12pp. 2310-2319 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: at-speed scan testing, IR-drop, capture-power-safety, logic path, clock path, clock stretch, test quality,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2016/11/01 Vol. E99-DNo. 11pp. 2672-2681 Type of Manuscript: PAPER Category: Computer System Keyword: low power test, data compression, LFSR, X-filling,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/09/01 Vol. E96-DNo. 9pp. 2003-2011 Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing) Category: Keyword: at-speed testing, ATPG, IR-drop, test power reduction, low power test,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2011/06/01 Vol. E94-DNo. 6pp. 1216-1226 Type of Manuscript: PAPER Category: Dependable Computing Keyword: ATPG, X-bit, X-identification, X-filling,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/01/01 Vol. E93-DNo. 1pp. 2-9 Type of Manuscript: Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs) Category: Keyword: power supply noise, test relaxation, X-filling, clock-gating, test compaction,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/03/01 Vol. E91-DNo. 3pp. 667-674 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs) Category: Fault Diagnosis Keyword: fault diagnosis, X-fault model, per-test, via,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/09/01 Vol. E90-DNo. 9pp. 1398-1405 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/11/01 Vol. E89-DNo. 11pp. 2756-2765 Type of Manuscript: PAPER Category: Dependable Computing Keyword: fault diagnosis, per-test, X-fault model,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/05/01 Vol. E89-DNo. 5pp. 1679-1686 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/09/01 Vol. E88-DNo. 9pp. 2126-2134 Type of Manuscript: PAPER Category: Dependable Computing Keyword: SOC testing, wrapper design, scan slices, overlapping,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/07/25 Vol. E81-DNo. 7pp. 654-659 Type of Manuscript: Special Section PAPER (Special Issue on Test and Diagnosis of VLSI) Category: Design for Testability Keyword: partial circuit duplication, random testing, design for testability, built-in self-test,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1995/07/25 Vol. E78-DNo. 7pp. 830-838 Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems) Category: Keyword: testable design, fault testing, highly observable condition, circuit conversion,