Wenpo ZHANG


Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/10/01
Vol. E97-D  No. 10  pp. 2719-2729
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small-delay defectsfault coveragesegmented scancontrol pointobservation point
 Summary | Full Text:PDF(752KB)

Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/03/01
Vol. E97-D  No. 3  pp. 533-540
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small-delay defectstest compactiontest application timetest data volumeon-chip delay measurement
 Summary | Full Text:PDF(435.6KB)

Improving Test Coverage by Measuring Path Delay Time Including Transmission Time of FF
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/05/01
Vol. E96-D  No. 5  pp. 1219-1222
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
small delay faultstest coverageflip-flopclock pulse
 Summary | Full Text:PDF(240.7KB)