Weidong TIAN


Leakage Current and Floating Gate Capacitor Matching Test
Weidong TIAN Joe R. TROGOLO Bob TODD 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1315-1320
Type of Manuscript:  INVITED PAPER (Special Section on Microelectronic Test Structures (ICMTS2007))
Category: 
Keyword: 
capacitorcharacterizationfloating gateleakagematching
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