Wang-Dauh TSENG


Power Reduction during Scan Testing Based on Multiple Capture Technique
Lung-Jen LEE Wang-Dauh TSENG Rung-Bin LIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 798-805
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
multiple capture techniquecapture violation problempattern insertiontest pattern reordering
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