Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/03/01 Vol. E89-CNo. 3pp. 349-355 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era) Category: Signal Integrity and Variability Keyword: delay testing, quality model, defect distribution,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/07/25 Vol. E81-DNo. 7pp. 689-696 Type of Manuscript: Special Section PAPER (Special Issue on Test and Diagnosis of VLSI) Category: IDDQ Testing Keyword: sequential circuit, test generation, IDDQ testing, bridging fault,
