Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/04/01 Vol. E92-CNo. 4pp. 453-459 Type of Manuscript: Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era) Category: Keyword: DDR interface, SoC, round-trip-time, loop-backed test,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/04/01 Vol. E86-CNo. 4pp. 624-634 Type of Manuscript: Special Section PAPER (Special Issue on High-Performance, Low-Power System LSIs and Related Technologies) Category: Design Methods and Implementation Keyword: embedded DRAM, various DRAM macros, low voltage operation, short TAT, BIST,
