Toshinori MORIHARA


A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test
Masaru HARAGUCHI Tokuya OSAWA Akira YAMAZAKI Chikayoshi MORISHIMA Toshinori MORIHARA Yoshikazu MOROOKA Yoshihiro OKUNO Kazutami ARIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 453-459
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
DDR interfaceSoCround-trip-timeloop-backed test
 Summary | Full Text:PDF

An Embedded DRAM Hybrid Macro with Auto Signal Management and Enhanced-on-Chip Tester
Naoya WATANABE Fukashi MORISHITA Yasuhiko TAITO Akira YAMAZAKI Tetsushi TANIZAKI Katsumi DOSAKA Yoshikazu MOROOKA Futoshi IGAUE Katsuya FURUE Yoshihiro NAGURA Tatsunori KOMOIKE Toshinori MORIHARA Atsushi HACHISUKA Kazutami ARIMOTO Hideyuki OZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/04/01
Vol. E86-C  No. 4  pp. 624-634
Type of Manuscript:  Special Section PAPER (Special Issue on High-Performance, Low-Power System LSIs and Related Technologies)
Category: Design Methods and Implementation
Keyword: 
embedded DRAMvarious DRAM macroslow voltage operationshort TATBIST
 Summary | Full Text:PDF