Toshihiro KAMEDA

NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time
Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1483-1491
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI, NBTI mitigation, performance degradation, scan path, aging, reliability, 
 Summary | Full Text:PDF
Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
Toshihiro KAMEDA Hiroaki KONOURA Dawood ALNAJJAR Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/08/01
Vol. E96-D  No. 8  pp. 1624-1631
Type of Manuscript:  Special Section PAPER (Special Section on Reconfigurable Systems)
Category: Test and Verification
Keyword: 
field test, fault avoidance, coarse-grained reconfigurable device, 
 Summary | Full Text:PDF