Toshifumi KOBAYASHI


Detection of CMOS Open Node Defects by Frequency Analysis
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/03/01
Vol. E90-D  No. 3  pp. 685-687
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
current testopen node defectfloating gate defectfrequency analysis
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CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 551-556
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
current testfloating gate defectopen defectdefect detection
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A Flexible Search Managing Circuitry for High-Density Dynamic CAMs
Takeshi HAMAMOTO Tadato YAMAGATA Masaaki MIHARA Yasumitsu MURAI Toshifumi KOBAYASHI Hideyuki OZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C  No. 8  pp. 1377-1384
Type of Manuscript:  Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories)
Category: General Technology
Keyword: 
content addressable memoryassociative memorydynamic memoryfunctional memory
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A Bitline Control Circuit Scheme and Redundancy Technique for High-Density Dynamic Content Addressable Memories
Tadato YAMAGATA Masaaki MIHARA Takeshi HAMAMOTO Yasumitsu MURAI Toshifumi KOBAYASHI Michihiro YAMADA Hideyuki OZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C  No. 11  pp. 1657-1664
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: Application Specific Memory
Keyword: 
content addressable memoryassociative memorydynamic memoryredundancy
 Summary | Full Text:PDF