IEICE Trans

Tokumi YOKOHIRA

Throughput Improvement for TCP with a Performance Enhancing Proxy Using a UDP-Like Packet Sending Policy Hui WANG Yuichi NISHIDA Yukinobu FUKUSHIMA Tokumi YOKOHIRA Zhen WU
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2012/07/01 Vol. E95-B No. 7 pp. 2344-2357 Type of Manuscript: PAPER Category: Internet Keyword: TCP, performance enhance proxy, PEP, watermark, throughput, fairness,
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An Architecture and a MAC Protocol for Throughput Improvement in Light Trail Networks Wenjie CHEN Yukinobu FUKUSHIMA Tokumi YOKOHIRA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2012/07/01 Vol. E95-B No. 7 pp. 2330-2343 Type of Manuscript: PAPER Category: Network Keyword: light trail network, medium access control (MAC), token passing, linear programming problem,
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Detection of CMOS Open Node Defects by Frequency Analysis Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/03/01 Vol. E90-D No. 3 pp. 685-687 Type of Manuscript: LETTER Category: Dependable Computing Keyword: current test, open node defect, floating gate defect, frequency analysis,
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Effect of Premature ACK Transmission Timing on Throughput in TCP with a Performance Enhancing Proxy Hui WANG Shigeyuki OSADA Tokumi YOKOHIRA Kiyohiko OKAYAMA Nariyoshi YAMAI
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2007/01/01 Vol. E90-B No. 1 pp. 31-41 Type of Manuscript: PAPER Category: Network Keyword: TCP, performance enhancing proxy, PEP, premature ACK, watermark,
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High-Speed Calculation of Worst-Case Link Delays in the EDD Connection Admission Control Scheme Tokumi YOKOHIRA Kiyohiko OKAYAMA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2006/07/01 Vol. E89-B No. 7 pp. 2012-2022 Type of Manuscript: PAPER Category: Network Keyword: real time communication, quality of service, connection admission control, worst-case link delays, earliest due date first scheduling,
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Node Placement Algorithms in the Case that Routes are Design Variables in Shuffle-Like Multihop Lightwave Networks Tokumi YOKOHIRA Kiyohiko OKAYAMA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2005/12/01 Vol. E88-B No. 12 pp. 4578-4587 Type of Manuscript: PAPER Category: Network Keyword: wavelength-division multiplexing, logical topology, shuffle-like network, node placement, wavelength assignment,
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CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-D No. 3 pp. 551-556 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Fault Detection Keyword: current test, floating gate defect, open defect, defect detection,
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A Quasi-Solution State Evolution Algorithm for Channel Assignment Problems in Cellular Networks Nobuo FUNABIKI Toru NAKANISHI Tokumi YOKOHIRA Shigeto TAJIMA Teruo HIGASHINO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2002/05/01 Vol. E85-A No. 5 pp. 977-987 Type of Manuscript: Special Section PAPER (Special Section on Discrete Mathematics and Its Applications) Category: Keyword: CAP, approximation algorithm, benchmark, NP-hard, cellular network,
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Testing for the Programming Circuit of SRAM-Based FPGAs Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Tomoo INOUE Hideo FUJIWARA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1999/06/25 Vol. E82-D No. 6 pp. 1051-1057 Type of Manuscript: PAPER Category: Fault Tolerant Computing Keyword: fault detection, LUT-based FPGA, SRAM-based FPGA, functional fault, configuration,
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The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs Tokumi YOKOHIRA Toshimi SHIMIZU Hiroyuki MICHINISHI Yuji SUGIYAMA Takuji OKAMOTO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1995/07/25 Vol. E78-D No. 7 pp. 874-881 Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems) Category: Keyword: built-in self-test, exhaustive testing, test pattern generation, minimum test set, dependence matrix,
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Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1993/07/25 Vol. E76-D No. 7 pp. 791-799 Type of Manuscript: Special Section PAPER (Special Issue on VLSI Testing and Testable Design) Category: Keyword: built-in-self-test, pseudoexhaustive testing, verification testing, locally exhaustive testing, test pattern generation,
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Test Set for a Multibit Shifter Constructed with Multiplexers Tokumi YOKOHIRA Hiroyuki MICHINISHI Takuji OKAMOTO Yuji SUGIYAMA
Publication: IEICE TRANSACTIONS (1976-1990) Publication Date: 1990/08/25 Vol. E73-E No. 8 pp. 1301-1309 Type of Manuscript: Special Section PAPER (Special Issue on Fault-Tolerant Systems) Category: Keyword:
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