Tiebin WU


A Novel Test Data Compression Scheme for SoCs Based on Block Merging and Compatibility
Tiebin WU Hengzhu LIU Botao ZHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7  pp. 1452-1460
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
test data compressionblock mergingcompatibilitytest application timecode-based testingsystem-on-chip (SoC)
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