Tian XIE


Partial Label Metric Learning Based on Statistical Inference
Tian XIE Hongchang CHEN Tuosiyu MING Jianpeng ZHANG Chao GAO Shaomei LI Yuehang DING 
Publication:   
Publication Date: 2020/06/01
Vol. E103-D  No. 6  pp. 1355-1361
Type of Manuscript:  PAPER
Category: Artificial Intelligence, Data Mining
Keyword: 
partial label learningmetric learningstatistical inferencelikelihood-ratio test
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