Thomas CLOUQUEUR


Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on τk-Notation
Chia Yee OOI Thomas CLOUQUEUR Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/08/01
Vol. E90-D  No. 8  pp. 1202-1212
Type of Manuscript:  PAPER
Category: Complexity Theory
Keyword: 
easily testablestuck-at faultspath delay faultstest generation complexity
 Summary | Full Text:PDF(367.4KB)

Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch
Yoshiyuki NAKAMURA Thomas CLOUQUEUR Kewal K. SALUJA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/03/01
Vol. E89-D  No. 3  pp. 1165-1172
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
BISTfault diagnosiserror identificationat-speed testlow speed tester
 Summary | Full Text:PDF(462.4KB)

Classification of Sequential Circuits Based on τk Notation and Its Applications
Chia Yee OOI Thomas CLOUQUEUR Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/12/01
Vol. E88-D  No. 12  pp. 2738-2747
Type of Manuscript:  PAPER
Category: VLSI Systems
Keyword: 
test generationeasily testable sequential circuitscomplexitydesign for testabilitysynthesis for testability
 Summary | Full Text:PDF(391.4KB)