Tetsuo KAWAKITA


Reliability of Low Temperature Poly-Si GOLD (Gate-Overlapped LDD) Structure TFTs
Tetsuo KAWAKITA Hidehiro NAKAGAWA Yukiharu URAOKA Takashi FUYUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/11/01
Vol. E85-C  No. 11  pp. 1854-1859
Type of Manuscript:  Special Section PAPER (Special Issue on Electronic Displays)
Category: Active Matrix Displays
Keyword: 
low temperature poly-SiTFTreliabilityGOLDsystem on panel
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Thin Package of LSI by Transferred Bump TAB Technology
Tetsuo KAWAKITA Kenzo HATADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/08/25
Vol. E74-C  No. 8  pp. 2349-2354
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Packaging Technology for Microelectronics Manufacturing)
Category: Interconnection
Keyword: 
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