Tatsuya MATANO


A Distributive Serial Multi-Bit Parallel Test Scheme for Large Capacity DRAMs
Tadahiko SUGIBAYASHI Isao NARITAKE Hiroshi TAKADA Ken INOUE Ichiro YAMAMOTO Tatsuya MATANO Mamoru FUJITA Yoshiharu AIMOTO Toshio TAKESHIMA Satoshi UTSUGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C  No. 8  pp. 1323-1327
Type of Manuscript:  Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories)
Category: DRAM
Keyword: 
memoryDRAMtest
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