Tatsunori KOMOIKE


An Embedded DRAM Hybrid Macro with Auto Signal Management and Enhanced-on-Chip Tester
Naoya WATANABE Fukashi MORISHITA Yasuhiko TAITO Akira YAMAZAKI Tetsushi TANIZAKI Katsumi DOSAKA Yoshikazu MOROOKA Futoshi IGAUE Katsuya FURUE Yoshihiro NAGURA Tatsunori KOMOIKE Toshinori MORIHARA Atsushi HACHISUKA Kazutami ARIMOTO Hideyuki OZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/04/01
Vol. E86-C  No. 4  pp. 624-634
Type of Manuscript:  Special Section PAPER (Special Issue on High-Performance, Low-Power System LSIs and Related Technologies)
Category: Design Methods and Implementation
Keyword: 
embedded DRAMvarious DRAM macroslow voltage operationshort TATBIST
 Summary | Full Text:PDF

Accomplishment of At-Speed BISR for Embedded DRAMs
Yoshihiro NAGURA Yoshinori FUJIWARA Katsuya FURUE Ryuji OHMURA Tatsunori KOMOIKE Takenori OKITAKA Tetsushi TANIZAKI Katsumi DOSAKA Kazutami ARIMOTO Yukiyoshi KODA Tetsuo TADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1498-1505
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword: 
at-speed testBISRembedded DRAMtest cost reduction
 Summary | Full Text:PDF