Takuya MARUIZUMI


Hot Carrier Induced Degradation Due to Multi-Phonon Mechanism Analyzed by Lattice and Device Monte Carlo Coupled Simulation
Shirun HO Yasuyuki OHKURA Takuya MARUIZUMI Prasad JOSHI Naoki NAKAMURA Shoichi KUBO Sigeo IHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3  pp. 336-349
Type of Manuscript:  INVITED PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
 Summary | Full Text:PDF