Takumi UEZONO


A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation
Takumi UEZONO Kazuya MASU Takashi SATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C  No. 3  pp. 324-331
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
voltage measurementspatial voltage drop fluctuationprocess variationpower/signal integrity
 Summary | Full Text:PDF

One-Shot Voltage-Measurement Circuit Utilizing Process Variation
Takumi UEZONO Takashi SATO Kazuya MASU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4  pp. 1024-1030
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
voltage measurementprocess variationpower/signal integrity
 Summary | Full Text:PDF

Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network
Shiho HAGIWARA Takumi UEZONO Takashi SATO Kazuya MASU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/04/01
Vol. E91-A  No. 4  pp. 951-956
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 20th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
voltage drop analysispower distribution networkcorrelation coefficientmultiple regression
 Summary | Full Text:PDF

Statistical Modeling of a Via Distribution for Yield Estimation
Takumi UEZONO Kenichi OKADA Kazuya MASU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Vol. E89-A  No. 12  pp. 3579-3584
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Interconnect
Keyword: 
via distributionyield estimationwire length distribution
 Summary | Full Text:PDF

Wire Length Distribution Model for System LSI
Takanori KYOGOKU Junpei INOUE Hidenari NAKASHIMA Takumi UEZONO Kenichi OKADA Kazuya MASU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A  No. 12  pp. 3445-3452
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Interconnect
Keyword: 
wire length distributioncore utilizationSoClayout-area allocation
 Summary | Full Text:PDF