Takuji OKAMOTO


Detection of CMOS Open Node Defects by Frequency Analysis
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/03/01
Vol. E90-D  No. 3  pp. 685-687
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
current testopen node defectfloating gate defectfrequency analysis
 Summary | Full Text:PDF(139.3KB)

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 551-556
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
current testfloating gate defectopen defectdefect detection
 Summary | Full Text:PDF(459.5KB)

Testing for the Programming Circuit of SRAM-Based FPGAs
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Tomoo INOUE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/06/25
Vol. E82-D  No. 6  pp. 1051-1057
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
fault detectionLUT-based FPGASRAM-based FPGAfunctional faultconfiguration
 Summary | Full Text:PDF(608.4KB)

The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs
Tokumi YOKOHIRA Toshimi SHIMIZU Hiroyuki MICHINISHI Yuji SUGIYAMA Takuji OKAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7  pp. 874-881
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
built-in self-testexhaustive testingtest pattern generationminimum test setdependence matrix
 Summary | Full Text:PDF(631.4KB)

Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7  pp. 791-799
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
built-in-self-testpseudoexhaustive testingverification testinglocally exhaustive testingtest pattern generation
 Summary | Full Text:PDF(734.4KB)

An Algebraic Specification of a Daisy Chain Arbiter
Yu Rong HOU Atsushi OHNISHI Yuji SUGIYAMA Takuji OKAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1992/11/25
Vol. E75-D  No. 6  pp. 778-784
Type of Manuscript:  Special Section PAPER (Special Issue on Pacific Rim International Symposium on Fault Tolerant Systems)
Category: 
Keyword: 
specificationalgebraic methodasynchronous circuitsarbiter
 Summary | Full Text:PDF(577.7KB)

Test Set for a Multibit Shifter Constructed with Multiplexers
Tokumi YOKOHIRA Hiroyuki MICHINISHI Takuji OKAMOTO Yuji SUGIYAMA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1990/08/25
Vol. E73-E  No. 8  pp. 1301-1309
Type of Manuscript:  Special Section PAPER (Special Issue on Fault-Tolerant Systems)
Category: 
Keyword: 
 Summary | Full Text:PDF(636KB)