Takeshi HIDAKA


Decananometer Surrounding Gate Transistor (SGT) Scalability by Using an Intrinsically-Doped Body and Gate Work Function Engineering
Yasue YAMAMOTO Takeshi HIDAKA Hiroki NAKAMURA Hiroshi SAKURABA Fujio MASUOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/04/01
Vol. E89-C  No. 4  pp. 560-567
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
Surrounding Gate Transistor (SGT)scalingintrinsic channelgate work function engineering
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