Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/07/01 Vol. E89-CNo. 7pp. 943-948 Type of Manuscript: Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM2005) Category: High-Speed HBTs and ICs Keyword: heterojunction bipolar transistor, reliability, rapid thermal annealing, GaAs, InGaP,