Takahide NAKAMURA


A New Hierarchical RSM for TCAD-Based Device Design in 0.4µm CMOS Development
Hisako SATO Katsumi TSUNENO Kimiko AOYAMA Takahide NAKAMURA Hisaaki KUNITOMO Hiroo MASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2  pp. 226-233
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Statistical Analysis
Keyword: 
TCADRSMCMOS design
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