Takahide ISHIKAWA


The Maximum Operating Region in SiGe HBTs for RF Power Amplifiers
Akira INOUE Shigenori NAKATSUKA Takahide ISHIKAWA Yoshio MATSUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 714-719
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
maximum operating regionmeasurementwaveformSiGepower amplifierHBT
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Analysis of a Phase Factor of Franz-Keldysh Oscillations in GaAs/AlGaAs Heterostructures
Hideo TAKEUCHI Yoshitsugu YAMAMOTO Ryo HATTORI Takahide ISHIKAWA Masaaki NAKAYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/10/01
Vol. E86-C  No. 10  pp. 2015-2021
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Microelectronics with TWHM2003)
Category: 
Keyword: 
GaAs/AlGaAs heterostructuresphotoreflectanceFranz-Keldysh oscillations
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Analyses on Monolithic InP HEMT Resistive Mixer Operating under Very Low LO Power
Takuo KASHIWA Kazuya YAMAMOTO Takayuki KATOH Takao ISHIDA Takahide ISHIKAWA Yasuo MITSUI Yoshikazu NAKAYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/10/25
Vol. E82-C  No. 10  pp. 1831-1838
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
resistive mixerLO powerconversion lossInP HEMTconductance
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Automated Millimeter-Wave On-Wafer Testing System
Takayuki KATOH Takuo KASHIWA Hiroyuki HOSHI Akira INOUE Takahide ISHIKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/07/25
Vol. E82-C  No. 7  pp. 1312-1317
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
Category: Measurements
Keyword: 
millimeter waveS-parameternoise figureMMICon-wafer measurement
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A Study on Reliability and Failure Mechanism of T-Shaped Gate HEMTs
Takahide ISHIKAWA Kenji HOSOGI Masafumi KATSUMATA Hiroyuki MINAMI Yasuo MITSUI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1  pp. 158-165
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Failure Physics and Failure Analysis
Keyword: 
T-Shaped gate HEMTvon Mises stressrecess depthstress concentration
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Focused Ion Beam Trimming Techniques for MMIC Circuit Optimization
Takahide ISHIKAWA Makio KOMARU Kazuhiko ITOH Katsuya KOSAKI Yasuo MITSUI Mutsuyuki OTSUBO Shigeru MITSUI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/06/25
Vol. E76-C  No. 6  pp. 891-900
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functions and Size-Reductions)
Category: 
Keyword: 
FIB (Focused Ion Beam)trimmingcircuit optimizationMMIC
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