IEICE Trans

Takahide IKEDA

A 0.65-ns, 72-kb ECL-CMOS RAM Macro for a 1-Mb SRAM Hiroaki NAMBU Kazuo KANETANI Youji IDEI Toru MASUDA Keiichi HIGETA Masayuki OHAYASHI Masami USAMI Kunihiko YAMAGUCHI Toshiyuki KIKUCHI Takahide IKEDA Kenichi OHHATA Takeshi KUSUNOKI Noriyuki HOMMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/06/25 Vol. E78-C No. 6 pp. 739-747 Type of Manuscript: Special Section PAPER (Special Issue on the 1994 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol. 30, No. 4 April 1995)) Category: Keyword:
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A Bipolar-Based 0.5 µm BiCMOS Technology on Bonded SOI for High-Speed LSIs Makoto YOSHIDA Toshiro HIRAMOTO Tsuyoshi FUJIWARA Takashi HASHIMOTO Tetsuya MURAYA Shigeharu MURATA Kunihiko WATANABE Nobuo TAMBA Takahide IKEDA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/08/25 Vol. E77-C No. 8 pp. 1395-1403 Type of Manuscript: Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories) Category: General Technology Keyword: BiCMOS, bonded SOI, double polysilicon bipolar, trench isolation, stress,
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Noise Reduction Techniques for a 64-kb ECL-CMOS SRAM with a 2-ns Cycle Time Kenichi OHHATA Yoshiaki SAKURAI Hiroaki NAMBU Kazuo KANETANI Youji IDEI Toshirou HIRAMOTO Nobuo TAMBA Kunihiko YAMAGUCHI Masanori ODAKA Kunihiko WATANABE Takahide IKEDA Noriyuki HOMMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/11/25 Vol. E76-C No. 11 pp. 1611-1619 Type of Manuscript: Special Section PAPER (Special Issue on LSI Memories) Category: SRAM Keyword: ECL-CMOS SRAM, 64-kb, noise reduction, crosstalk,
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Redundancy Technique for Ultra-High-Speed Static RAMs Hiroaki NAMBU Kazuo KANETANI Youji IDEI Kunihiko YAMAGUCHI Toshirou HIRAMOTO Nobuo TAMBA Kunihiko WATANABE Masanori ODAKA Takahide IKEDA Kenichi OHHATA Yoshiaki SAKURAI Noriyuki HOMMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/04/25 Vol. E76-C No. 4 pp. 641-648 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: redundancy technique, static RAM (SRAM), focused ion beam (FIB), laser chemical vapor deposition (L-CVD), access time,
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High-Speed Sensing Techniques for Ultrahigh-Speed SRAM's Hiroaki NAMBU Kazuo KANETANI Youji IDEI Noriyuki HOMMA Kunihiko YAMAGUCHI Toshirou HIRAMOTO Nobuo TAMBA Masanori ODAKA Kunihiko WATANABE Takahide IKEDA Kenichi OHHATA Yoshiaki SAKURAI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/04/25 Vol. E75-C No. 4 pp. 530-538 Type of Manuscript: Special Section PAPER (Joint Special Issue on the 1991 VLSI Circuits Symposium) Category: Keyword:
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