Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A
No. 12
pp. 3318-3323
Type of Manuscript:
Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword:
BIST, test pattern generator, neighborhood pattern, LFSR, reseeding, |
