Takaharu FUJII


Performance Analysis of Parallel Test Generation for Combinational Circuits
Tomoo INOUE Takaharu FUJII Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1996/09/25
Vol. E79-D  No. 9  pp. 1257-1265
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
test generationparallel processingperformance analysisinterprocessor communicationspeedup
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