Tadao TAKEDA


Improvement of E-Beam Observability by Testing-Pad Placement in LSI Design Layout
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/02/25
Vol. E82-C  No. 2  pp. 387-392
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
E-beam testerobservabilitystacked viastesting padsmulti-level wiringlocal field effects
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Guided-Probe Diagnosis of LSIs Containing Macrocells
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7  pp. 731-737
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Beam Testing/Diagnosis
Keyword: 
electron beam testerguided-probe diagnosismacrocellmemory macrologic simulationlogic modelCAD navigation
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Database with LSI Failure Analysis Navigator
Takahiro ITO Tadao TAKEDA Shigeru NAKAJIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 272-276
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: CIM/CAM
Keyword: 
LSI failure analysisdatabaseobject-oriented database
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An On-Line Scheduler for ASIC Manufacturing Line Management
Tadao TAKEDA Satoshi TAZAWA Kou WADA Eisuke ARAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/25
Vol. E78-C  No. 3  pp. 241-247
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
schedulerASICTATalgorithm
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