Tadahiro OHMI


Effect of Nitrogen-Doped LaB6 Interfacial Layer on Device Characteristics of Pentacene-Based OFET
Yasutaka MAEDA Shun-ichiro OHMI Tetsuya GOTO Tadahiro OHMI 
Publication:   
Publication Date: 2017/05/01
Vol. E100-C  No. 5  pp. 463-467
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
pentaceneN-doped LaB6OFETsubthreshold swingaging characteristicgrain size
 Summary | Full Text:PDF(1.1MB)

High Quality Pentacene Film Formation on N-Doped LaB6 Donor Layer
Yasutaka MAEDA Shun-ichiro OHMI Tetsuya GOTO Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/05/01
Vol. E99-C  No. 5  pp. 535-540
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
LaB6OFETbottom-contactpentacenedendritic grainlamellar grain
 Summary | Full Text:PDF(2.2MB)

Influence of Si Surface Roughness on Electrical Characteristics of MOSFET with HfON Gate Insulator Formed by ECR Plasma Sputtering
Dae-Hee HAN Shun-ichiro OHMI Tomoyuki SUWA Philippe GAUBERT Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/05/01
Vol. E97-C  No. 5  pp. 413-418
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Si surface roughnessHfON gate insulatorECR plasma sputteringplasma oxidation1/f noiseTDDB
 Summary | Full Text:PDF(1.4MB)

Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces
Masahiro KONDA Akinobu TERAMOTO Tomoyuki SUWA Rihito KURODA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5  pp. 664-670
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
atomically flat silicon surfacesoff angleatomic force microscopy
 Summary | Full Text:PDF(1.9MB)

Performance Comparison between Equal-Average Equal-Variance Equal-Norm Nearest Neighbor Search (EEENNS) Method and Improved Equal-Average Equal-Variance Nearest Neighbor Search (IEENNS) Method for Fast Encoding of Vector Quantization
Zhibin PAN Koji KOTANI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/09/01
Vol. E88-D  No. 9  pp. 2218-2222
Type of Manuscript:  LETTER
Category: Image Processing and Video Processing
Keyword: 
encoding performancefast searchvector quantizationstatistical featuresEEENNS methodIEENNS method
 Summary | Full Text:PDF(682.5KB)

A 100 MHz 7.84 mm2 31.7 msec 439 mW 512-Point 2-Dimensional FFT Single-Chip Processor
Naoto MIYAMOTO Leo KARNAN Kazuyuki MARUO Koji KOTANI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/04/01
Vol. E87-C  No. 4  pp. 502-509
Type of Manuscript:  Special Section PAPER (Special Section on Low-Power System LSI, IP and Related Technologies)
Category: 
Keyword: 
fast Fourier transformcached-memory architecturedouble buffer structure
 Summary | Full Text:PDF(746.3KB)

A Fast Search Method for Vector Quantization Using Enhanced Sum Pyramid Data Structure
Zhibin PAN Koji KOTANI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/03/01
Vol. E87-A  No. 3  pp. 764-769
Type of Manuscript:  LETTER
Category: Image
Keyword: 
fast searchvector quantizationmulti-resolutionsenhanced sum pyramid
 Summary | Full Text:PDF(383.7KB)

An Improved Fast Encoding Algorithm for Vector Quantization Using 2-Pixel-Merging Sum Pyramid and Manhattan-Distance-First Check
Zhibin PAN Koji KOTANI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/02/01
Vol. E87-D  No. 2  pp. 494-499
Type of Manuscript:  LETTER
Category: Image Processing, Image Pattern Recognition
Keyword: 
fast encodingVQ2-pixel-mergingsum pyramidthe Cauchy-Schwarz inequalityManhattan-distance-first
 Summary | Full Text:PDF(534KB)

A Fast Encoding Method for Vector Quantization Using L1 and L2 Norms to Narrow Necessary Search Scope
Zhibin PAN Koji KOTANI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/11/01
Vol. E86-D  No. 11  pp. 2483-2486
Type of Manuscript:  LETTER
Category: Image Processing, Image Pattern Recognition
Keyword: 
vector quantizationfast searchL1 and L2 norm
 Summary | Full Text:PDF(299.6KB)

A Fast Encoding Method for Vector Quantization Based on 2-Pixel-Merging Sum Pyramid Data Structure
Zhibin PAN Koji KOTANI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/09/01
Vol. E86-A  No. 9  pp. 2419-2423
Type of Manuscript:  LETTER
Category: Image
Keyword: 
vector quantizationfast search2-pixel-mergingsum pyramid
 Summary | Full Text:PDF(467.8KB)

Analysis of High-Speed Signal Behavior in a Miniaturized Interconnect
Akihiro MORIMOTO Koji KOTANI Kazushi TAKAHASHI Shigetoshi SUGAWA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1111-1118
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Sub-0.1 µm CMOS Devices)
Category: 
Keyword: 
giga-scale integrationminiaturized interconnectMaxwell's equationsGHz signal propagationgas-isolated interconnect
 Summary | Full Text:PDF(545.5KB)

The Nature of Metallic Contamination on Various Silicon Substrates
Geun-Min CHOI Hiroshi MORITA Jong-Soo KIM Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/10/25
Vol. E82-C  No. 10  pp. 1839-1845
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
crystalline siliconamorphous siliconcontamination solutionnative oxidecopper impurity
 Summary | Full Text:PDF(1.5MB)

Fully-Parallel VLSI Implementation of Vector Quantization Processor Using Neuron-MOS Technology
Akira NAKADA Masahiro KONDA Tatsuo MORIMOTO Takemi YONEZAWA Tadashi SHIBATA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/09/25
Vol. E82-C  No. 9  pp. 1730-1738
Type of Manuscript:  Special Section PAPER (Special Issue on Integrated Electronics and New System Paradigms)
Category: Processors
Keyword: 
vector quantizationwinner-take-allneuron MOSimage compressionanalog LSI
 Summary | Full Text:PDF(1.4MB)

A Compact Memory-Merged Vector-Matching Circuitry for Neuron-MOS Associative Processor
Masahiro KONDA Tadashi SHIBATA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/09/25
Vol. E82-C  No. 9  pp. 1715-1721
Type of Manuscript:  Special Section PAPER (Special Issue on Integrated Electronics and New System Paradigms)
Category: Processors
Keyword: 
νMOSabsolute value of differenceManhattan distanceassociative processorboot-strap effect
 Summary | Full Text:PDF(1.4MB)

Fast Computational Architectures to Decrease Redundant Calculations -- Eliminating Redundant Digit Calculation and Excluding Useless Data
Makoto IMAI Toshiyuki NOZAWA Masanori FUJIBAYASHI Koji KOTANI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/09/25
Vol. E82-C  No. 9  pp. 1707-1714
Type of Manuscript:  Special Section PAPER (Special Issue on Integrated Electronics and New System Paradigms)
Category: Processors
Keyword: 
MSD-first architecturedigit-serial architecturenumerical characteristicpreprocessing architecturevector quantization
 Summary | Full Text:PDF(2.3MB)

Automatic Defect Pattern Detection on LSI Wafers Using Image Processing Techniques
Kazuyuki MARUO Tadashi SHIBATA Takahiro YAMAGUCHI Masayoshi ICHIKAWA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6  pp. 1003-1012
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
defect detectionimage processingimage recognitionHough transformwavelet transform
 Summary | Full Text:PDF(1.9MB)

Functionality Enhancement in Elemental Devices for Implementing Intelligence on Integrated Circuits
Tadahiro OHMI Tadashi SHIBATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/25
Vol. E80-C  No. 7  pp. 841-848
Type of Manuscript:  INVITED PAPER (Special Issue on New Concept Device and Novel Architecture LSIs)
Category: 
Keyword: 
neuron MOSfour-terminal devicewinner take allassociate memoryfluxware
 Summary | Full Text:PDF(725.4KB)

Low Power Neuron-MOS Technology for High-Functionality Logic Gate Synthesis
Ho-Yup KWON Koji KOTANI Tadashi SHIBATA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/25
Vol. E80-C  No. 7  pp. 924-930
Type of Manuscript:  Special Section PAPER (Special Issue on New Concept Device and Novel Architecture LSIs)
Category: Novel Concept Devices
Keyword: 
neuron MOSdeep-thresholdlow powerfull addernumber detector
 Summary | Full Text:PDF(514.5KB)

FOREWORD
Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 255-255
Type of Manuscript:  FOREWORD
Category: 
Keyword: 
 Summary | Full Text:PDF(102.7KB)

Impact of High-Precision Processing on the Functional Enhancement of Neuron-MOS Integrated Circuits
Koji KOTANI Tadashi SHIBATA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 407-414
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: Device Issues
Keyword: 
high-precision processingneuron-MOShigh-functionality circuitultra clean technologymultiple-valued logic
 Summary | Full Text:PDF(729.7KB)

Improvement of PECVD-SiNx for TFT Gate Insulator by Controlling Ion Bombardment Energy
Yasuhiko KASAMA Tadahiro OHMI Koichi FUKUDA Hirobumi FUKUI Chisato IWASAKI Shoichi ONO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 398-406
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: Device Issues
Keyword: 
TFTgate insulatorPECVDion fluxion energy
 Summary | Full Text:PDF(1MB)

Cr2O3 Passivated Gas Tubing System for Specialty Gases
Yasuyuki SHIRAI Masaki NARAZAKI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 385-391
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: 
Keyword: 
Cr2O3ferritic stainless steeldry down performancecatalytic behaviorcorrosion resistance
 Summary | Full Text:PDF(839KB)

Advanced Fluorite Regeneration Technology to Recover Spent Fluoride Chemicals Drained from Semi-conductor Manufacturing Process
Nobuhiro MIKI Matagoro MAENO Toshiro FUKUDOME Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 363-374
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: High-Performance Processing
Keyword: 
granular fluorite regenerationcalcite columndirect conversion
 Summary | Full Text:PDF(942.5KB)

A Model for the Electrochemical Deposition and Removal of Metallic Impurities on Si Surfaces
Hitoshi MORINAGA Makoto SUYAMA Masashi NOSE Steven VERHAVERBEKE Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 343-362
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: High-Performance Processing
Keyword: 
metallic impuritiesmetal-induced pitsredox poten-tialsurfactantchelating agent
 Summary | Full Text:PDF(1.7MB)

Neutralization of Static Electricity by Soft X-Ray and Vacuum Ultraviolet(UV)-Ray Irradiation
Hitoshi INABA Tadahiro OHMI Takanori YOSHIDA Takao OKADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3  pp. 328-336
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: Particle/Defect Control and Analysis
Keyword: 
ionizerneutralizationionizationsoft X-raysvac-uum UV rays
 Summary | Full Text:PDF(673.7KB)

The Concept of Four-Terminal Devices and Its Significance in the Implementation of Intelligent Integrated Circuits
Tadahiro OHMI Tadashi SHIBATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/07/25
Vol. E77-C  No. 7  pp. 1032-1041
Type of Manuscript:  Special Section PAPER (Special Issue on Super Chip for Intelligent Integrated Systems)
Category: 
Keyword: 
four-terminal deviceneuron MOS transistorbinary-multiple-analog merged hardware algorithmsintelligent intetrated circuit
 Summary | Full Text:PDF(890.3KB)

Self-Aligned Aluminum-Gate MOSFET's Having Ultra-Shallow Junctions Formed by 450 Furnace Annealing
Koji KOTANI Tadahiro OHMI Satoshi SHIMONISHI Tomohiro MIGITA Hideki KOMORI Tadashi SHIBATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4  pp. 541-547
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
aluminum gateself alignultraclean ion-implantation450 furnace annealing
 Summary | Full Text:PDF(602.6KB)

Characterizing Film Quality and Electromigration Resistance of Giant-Grain Copper Interconnects
Takahisa NITTA Tadahiro OHMI Tsukasa HOSHI Toshiyuki TAKEWAKI Tadashi SHIBATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4  pp. 626-634
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Process Technology
Keyword: 
copper interconnectsgiant-grainelectromigrationlow-kinetic-energy ion bombardment process
 Summary | Full Text:PDF(793KB)

Minimizing the Edge Effect in a DRAM Cell Capacitor by Using a Structure with High-Permittivity Thin Film
Takeo YAMASHITA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4  pp. 556-561
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
suppression of edge effecthigh permittivity materialsimplified DRAM cell capacitorhigh density DRAMs
 Summary | Full Text:PDF(497.6KB)

Neuron MOS Voltage-Mode Circuit Technology for Multiple-Valued Logic
Tadashi SHIBATA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/03/25
Vol. E76-C  No. 3  pp. 347-356
Type of Manuscript:  INVITED PAPER (Special Issue on Multiple-Valued Integrated Circuits)
Category: 
Keyword: 
neuron mos transistorfunctional devicevoltage mode computationmultiple-valued logicuniversal literal
 Summary | Full Text:PDF(962.7KB)

FOREWORD
Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7  pp. 755-756
Type of Manuscript:  FOREWORD
Category: 
Keyword: 
 Summary | Full Text:PDF(137.7KB)

Plasma-Parameter-Extraction for Minimizing Contamination and Damage in RIE Processes
Takeo YAMASHITA Satoshi HASAKA Iwao NATORI Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7  pp. 839-843
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
ion energyion fluxcontaminationion energy-flux parameter map
 Summary | Full Text:PDF(459KB)

The Segregation and Removal of Metallic Impurities at the Interface of Silicon Wafer Surface and Liquid Chemicals
Takashi IMAOKA Takehiko KEZUKA Jun TAKANO Isamu SUGIYAMA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7  pp. 816-828
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
metallic impuritysegregationwafer cleaning
 Summary | Full Text:PDF(1013.4KB)

Influence of Vacancy in Silicon Wafer of Various Types on Surface Microroughness in Wet Chemical Process
Tadahiro OHMI Toshihito TSUGA Jun TAKANO Masahiko KOGURE Koji MAKIHARA Takayuki IMAOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7  pp. 800-808
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
surface microroughnessvacancysillicon waferwet chemical processdiffusionMOS diodothin oxide film
 Summary | Full Text:PDF(874.9KB)

Optimization of Photolithography Developing Process without Residual Surfactant on Surfaces
Hisayuki SHIMADA Shigeki SHIMOMURA Kouichi HIROSE Masanobu ONODERA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7  pp. 844-851
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
developersurfactantcarbonhydrogen peroxideozone
 Summary | Full Text:PDF(864.8KB)