IEICE Trans

Tadahiro OHMI

Effect of Nitrogen-Doped LaB₆ Interfacial Layer on Device Characteristics of Pentacene-Based OFET Yasutaka MAEDA Shun-ichiro OHMI Tetsuya GOTO Tadahiro OHMI
Publication: Publication Date: 2017/05/01 Vol. E100-C No. 5 pp. 463-467 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: pentacene, N-doped LaB₆, OFET, subthreshold swing, aging characteristic, grain size,
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High Quality Pentacene Film Formation on N-Doped LaB₆ Donor Layer Yasutaka MAEDA Shun-ichiro OHMI Tetsuya GOTO Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2016/05/01 Vol. E99-C No. 5 pp. 535-540 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: LaB₆, OFET, bottom-contact, pentacene, dendritic grain, lamellar grain,
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Influence of Si Surface Roughness on Electrical Characteristics of MOSFET with HfON Gate Insulator Formed by ECR Plasma Sputtering Dae-Hee HAN Shun-ichiro OHMI Tomoyuki SUWA Philippe GAUBERT Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2014/05/01 Vol. E97-C No. 5 pp. 413-418 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: Si surface roughness, HfON gate insulator, ECR plasma sputtering, plasma oxidation, 1/f noise, TDDB,
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Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces Masahiro KONDA Akinobu TERAMOTO Tomoyuki SUWA Rihito KURODA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/05/01 Vol. E92-C No. 5 pp. 664-670 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: atomically flat silicon surfaces, off angle, atomic force microscopy,
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Performance Comparison between Equal-Average Equal-Variance Equal-Norm Nearest Neighbor Search (EEENNS) Method and Improved Equal-Average Equal-Variance Nearest Neighbor Search (IEENNS) Method for Fast Encoding of Vector Quantization Zhibin PAN Koji KOTANI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/09/01 Vol. E88-D No. 9 pp. 2218-2222 Type of Manuscript: LETTER Category: Image Processing and Video Processing Keyword: encoding performance, fast search, vector quantization, statistical features, EEENNS method, IEENNS method,
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A 100 MHz 7.84 mm² 31.7 msec 439 mW 512-Point 2-Dimensional FFT Single-Chip Processor Naoto MIYAMOTO Leo KARNAN Kazuyuki MARUO Koji KOTANI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/04/01 Vol. E87-C No. 4 pp. 502-509 Type of Manuscript: Special Section PAPER (Special Section on Low-Power System LSI, IP and Related Technologies) Category: Keyword: fast Fourier transform, cached-memory architecture, double buffer structure,
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A Fast Search Method for Vector Quantization Using Enhanced Sum Pyramid Data Structure Zhibin PAN Koji KOTANI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/03/01 Vol. E87-A No. 3 pp. 764-769 Type of Manuscript: LETTER Category: Image Keyword: fast search, vector quantization, multi-resolutions, enhanced sum pyramid,
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An Improved Fast Encoding Algorithm for Vector Quantization Using 2-Pixel-Merging Sum Pyramid and Manhattan-Distance-First Check Zhibin PAN Koji KOTANI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/02/01 Vol. E87-D No. 2 pp. 494-499 Type of Manuscript: LETTER Category: Image Processing, Image Pattern Recognition Keyword: fast encoding, VQ, 2-pixel-merging, sum pyramid, the Cauchy-Schwarz inequality, Manhattan-distance-first,
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A Fast Encoding Method for Vector Quantization Using L₁ and L₂ Norms to Narrow Necessary Search Scope Zhibin PAN Koji KOTANI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2003/11/01 Vol. E86-D No. 11 pp. 2483-2486 Type of Manuscript: LETTER Category: Image Processing, Image Pattern Recognition Keyword: vector quantization, fast search, L₁ and L₂ norm,
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A Fast Encoding Method for Vector Quantization Based on 2-Pixel-Merging Sum Pyramid Data Structure Zhibin PAN Koji KOTANI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2003/09/01 Vol. E86-A No. 9 pp. 2419-2423 Type of Manuscript: LETTER Category: Image Keyword: vector quantization, fast search, 2-pixel-merging, sum pyramid,
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Analysis of High-Speed Signal Behavior in a Miniaturized Interconnect Akihiro MORIMOTO Koji KOTANI Kazushi TAKAHASHI Shigetoshi SUGAWA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/05/01 Vol. E85-C No. 5 pp. 1111-1118 Type of Manuscript: Special Section PAPER (Special Issue on Advanced Sub-0.1 µm CMOS Devices) Category: Keyword: giga-scale integration, miniaturized interconnect, Maxwell's equations, GHz signal propagation, gas-isolated interconnect,
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The Nature of Metallic Contamination on Various Silicon Substrates Geun-Min CHOI Hiroshi MORITA Jong-Soo KIM Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/10/25 Vol. E82-C No. 10 pp. 1839-1845 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: crystalline silicon, amorphous silicon, contamination solution, native oxide, copper impurity,
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Fully-Parallel VLSI Implementation of Vector Quantization Processor Using Neuron-MOS Technology Akira NAKADA Masahiro KONDA Tatsuo MORIMOTO Takemi YONEZAWA Tadashi SHIBATA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/09/25 Vol. E82-C No. 9 pp. 1730-1738 Type of Manuscript: Special Section PAPER (Special Issue on Integrated Electronics and New System Paradigms) Category: Processors Keyword: vector quantization, winner-take-all, neuron MOS, image compression, analog LSI,
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A Compact Memory-Merged Vector-Matching Circuitry for Neuron-MOS Associative Processor Masahiro KONDA Tadashi SHIBATA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/09/25 Vol. E82-C No. 9 pp. 1715-1721 Type of Manuscript: Special Section PAPER (Special Issue on Integrated Electronics and New System Paradigms) Category: Processors Keyword: νMOS, absolute value of difference, Manhattan distance, associative processor, boot-strap effect,
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Fast Computational Architectures to Decrease Redundant Calculations -- Eliminating Redundant Digit Calculation and Excluding Useless Data Makoto IMAI Toshiyuki NOZAWA Masanori FUJIBAYASHI Koji KOTANI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/09/25 Vol. E82-C No. 9 pp. 1707-1714 Type of Manuscript: Special Section PAPER (Special Issue on Integrated Electronics and New System Paradigms) Category: Processors Keyword: MSD-first architecture, digit-serial architecture, numerical characteristic, preprocessing architecture, vector quantization,
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Automatic Defect Pattern Detection on LSI Wafers Using Image Processing Techniques Kazuyuki MARUO Tadashi SHIBATA Takahiro YAMAGUCHI Masayoshi ICHIKAWA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/06/25 Vol. E82-C No. 6 pp. 1003-1012 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: defect detection, image processing, image recognition, Hough transform, wavelet transform,
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Functionality Enhancement in Elemental Devices for Implementing Intelligence on Integrated Circuits Tadahiro OHMI Tadashi SHIBATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/07/25 Vol. E80-C No. 7 pp. 841-848 Type of Manuscript: INVITED PAPER (Special Issue on New Concept Device and Novel Architecture LSIs) Category: Keyword: neuron MOS, four-terminal device, winner take all, associate memory, fluxware,
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Low Power Neuron-MOS Technology for High-Functionality Logic Gate Synthesis Ho-Yup KWON Koji KOTANI Tadashi SHIBATA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/07/25 Vol. E80-C No. 7 pp. 924-930 Type of Manuscript: Special Section PAPER (Special Issue on New Concept Device and Novel Architecture LSIs) Category: Novel Concept Devices Keyword: neuron MOS, deep-threshold, low power, full adder, number detector,
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FOREWORD Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 255-255 Type of Manuscript: FOREWORD Category: Keyword:
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Impact of High-Precision Processing on the Functional Enhancement of Neuron-MOS Integrated Circuits Koji KOTANI Tadashi SHIBATA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 407-414 Type of Manuscript: Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology) Category: Device Issues Keyword: high-precision processing, neuron-MOS, high-functionality circuit, ultra clean technology, multiple-valued logic,
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Improvement of PECVD-SiN_x for TFT Gate Insulator by Controlling Ion Bombardment Energy Yasuhiko KASAMA Tadahiro OHMI Koichi FUKUDA Hirobumi FUKUI Chisato IWASAKI Shoichi ONO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 398-406 Type of Manuscript: Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology) Category: Device Issues Keyword: TFT, gate insulator, PECVD, ion flux, ion energy,
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Cr₂O₃ Passivated Gas Tubing System for Specialty Gases Yasuyuki SHIRAI Masaki NARAZAKI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 385-391 Type of Manuscript: Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology) Category: Keyword: Cr₂O₃, ferritic stainless steel, dry down performance, catalytic behavior, corrosion resistance,
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Advanced Fluorite Regeneration Technology to Recover Spent Fluoride Chemicals Drained from Semi-conductor Manufacturing Process Nobuhiro MIKI Matagoro MAENO Toshiro FUKUDOME Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 363-374 Type of Manuscript: Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology) Category: High-Performance Processing Keyword: granular fluorite regeneration, calcite column, direct conversion,
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A Model for the Electrochemical Deposition and Removal of Metallic Impurities on Si Surfaces Hitoshi MORINAGA Makoto SUYAMA Masashi NOSE Steven VERHAVERBEKE Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 343-362 Type of Manuscript: Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology) Category: High-Performance Processing Keyword: metallic impurities, metal-induced pits, redox poten-tial, surfactant, chelating agent,
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Neutralization of Static Electricity by Soft X-Ray and Vacuum Ultraviolet(UV)-Ray Irradiation Hitoshi INABA Tadahiro OHMI Takanori YOSHIDA Takao OKADA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 328-336 Type of Manuscript: Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology) Category: Particle/Defect Control and Analysis Keyword: ionizer, neutralization, ionization, soft X-rays, vac-uum UV rays,
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The Concept of Four-Terminal Devices and Its Significance in the Implementation of Intelligent Integrated Circuits Tadahiro OHMI Tadashi SHIBATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/07/25 Vol. E77-C No. 7 pp. 1032-1041 Type of Manuscript: Special Section PAPER (Special Issue on Super Chip for Intelligent Integrated Systems) Category: Keyword: four-terminal device, neuron MOS transistor, binary-multiple-analog merged hardware algorithms, intelligent intetrated circuit,
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Self-Aligned Aluminum-Gate MOSFET's Having Ultra-Shallow Junctions Formed by 450 Furnace Annealing Koji KOTANI Tadahiro OHMI Satoshi SHIMONISHI Tomohiro MIGITA Hideki KOMORI Tadashi SHIBATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/04/25 Vol. E76-C No. 4 pp. 541-547 Type of Manuscript: Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies) Category: Device Technology Keyword: aluminum gate, self align, ultraclean ion-implantation, 450 furnace annealing,
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Characterizing Film Quality and Electromigration Resistance of Giant-Grain Copper Interconnects Takahisa NITTA Tadahiro OHMI Tsukasa HOSHI Toshiyuki TAKEWAKI Tadashi SHIBATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/04/25 Vol. E76-C No. 4 pp. 626-634 Type of Manuscript: Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies) Category: Process Technology Keyword: copper interconnects, giant-grain, electromigration, low-kinetic-energy ion bombardment process,
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Minimizing the Edge Effect in a DRAM Cell Capacitor by Using a Structure with High-Permittivity Thin Film Takeo YAMASHITA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/04/25 Vol. E76-C No. 4 pp. 556-561 Type of Manuscript: Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies) Category: Device Technology Keyword: suppression of edge effect, high permittivity material, simplified DRAM cell capacitor, high density DRAMs,
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Neuron MOS Voltage-Mode Circuit Technology for Multiple-Valued Logic Tadashi SHIBATA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/03/25 Vol. E76-C No. 3 pp. 347-356 Type of Manuscript: INVITED PAPER (Special Issue on Multiple-Valued Integrated Circuits) Category: Keyword: neuron mos transistor, functional device, voltage mode computation, multiple-valued logic, universal literal,
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FOREWORD Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/07/25 Vol. E75-C No. 7 pp. 755-756 Type of Manuscript: FOREWORD Category: Keyword:
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Plasma-Parameter-Extraction for Minimizing Contamination and Damage in RIE Processes Takeo YAMASHITA Satoshi HASAKA Iwao NATORI Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/07/25 Vol. E75-C No. 7 pp. 839-843 Type of Manuscript: Special Section PAPER (Special Issue on Ultra Clean Technology) Category: Keyword: ion energy, ion flux, contamination, ion energy-flux parameter map,
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The Segregation and Removal of Metallic Impurities at the Interface of Silicon Wafer Surface and Liquid Chemicals Takashi IMAOKA Takehiko KEZUKA Jun TAKANO Isamu SUGIYAMA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/07/25 Vol. E75-C No. 7 pp. 816-828 Type of Manuscript: Special Section PAPER (Special Issue on Ultra Clean Technology) Category: Keyword: metallic impurity, segregation, wafer cleaning,
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Influence of Vacancy in Silicon Wafer of Various Types on Surface Microroughness in Wet Chemical Process Tadahiro OHMI Toshihito TSUGA Jun TAKANO Masahiko KOGURE Koji MAKIHARA Takayuki IMAOKA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/07/25 Vol. E75-C No. 7 pp. 800-808 Type of Manuscript: Special Section PAPER (Special Issue on Ultra Clean Technology) Category: Keyword: surface microroughness, vacancy, sillicon wafer, wet chemical process, diffusion, MOS diodo, thin oxide film,
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Optimization of Photolithography Developing Process without Residual Surfactant on Surfaces Hisayuki SHIMADA Shigeki SHIMOMURA Kouichi HIROSE Masanobu ONODERA Tadahiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/07/25 Vol. E75-C No. 7 pp. 844-851 Type of Manuscript: Special Section PAPER (Special Issue on Ultra Clean Technology) Category: Keyword: developer, surfactant, carbon, hydrogen peroxide, ozone,
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