Sudhakar M. REDDY

On Detection of Bridge Defects with Stuck-at Tests
Kohei MIYASE Kenta TERASHIMA Xiaoqing WEN Seiji KAJIHARA Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 683-689
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
defect based testing, test vector generation, test vector modification, bridging faults, fault extraction, 
 Summary | Full Text:PDF
Don't Care Identification and Statistical Encoding for Test Data Compression
Seiji KAJIHARA Kenjiro TANIGUCHI Kohei MIYASE Irith POMERANZ Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 544-550
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
test compression, don't care identification, Huffman's algorithm, test generation, 
 Summary | Full Text:PDF