Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C
No. 5
pp. 817-823
Type of Manuscript:
Special Section PAPER (Special Section on Microelectronic Test Structures)
Category:
Keyword:
capacitance, CV, gate dielectric, impedance, MOSFET, nitride, oxide, RF, S-parameters, |
