Si-Rong HE

An Incremental Simulation Technique Based on Delta Model for Lifetime Yield Analysis
Nguyen Cao QUI Si-Rong HE Chien-Nan Jimmy LIU 
Publication:   
Publication Date: 2017/11/01
Vol. E100-A  No. 11  pp. 2370-2378
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
delta circuit model, incremental simulation, lifetime yield reliability analysis, 
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