Shuji IKEDA


Mechanical Stress Simulation for Highly Reliable Deep-Submicron Devices
Hideo MIURA Shuji IKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6  pp. 830-838
Type of Manuscript:  INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
semiconductortransistorresidual stressstress analysisstress measurement
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Analog Circuit Design Methodology in a Low Power RISC Microprocessor
Koichiro ISHIBASHI Hisayuki HIGUCHI Toshinobu SHIMBO Kunio UCHIYAMA Kenji SHIOZAWA Naotaka HASHIMOTO Shuji IKEDA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1998/02/25
Vol. E81-A  No. 2  pp. 210-217
Type of Manuscript:  INVITED PAPER (Special Section on Analog Circuit Techniques in the Digital-Oriented Era)
Category: 
Keyword: 
microprocessorTLBCAM0. 35 µmCMOS
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A 12.5-ns 16-Mb CMOS SRAM with Common-Centroid-Geometry-Layout Sense Amplifiers
Koichiro ISHIBASHI Kunihiro KOMIYAJI Sadayuki MORITA Toshiro AOTO Shuji IKEDA Kyoichiro ASAYAMA Atsuyosi KOIKE Toshiaki YAMANAKA Naotaka HASHIMOTO Haruhito IIDA Fumio KOJIMA Koichi MOTOHASHI Katsuro SASAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/05/25
Vol. E77-C  No. 5  pp. 741-748
Type of Manuscript:  Special Section PAPER (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))
Category: 
Keyword: 
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