Shu MIMURA


Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design
Norio SADACHIKA Shu MIMURA Akihiro YUMISAKI Kou JOHGUCHI Akihiro KAYA Mitiko MIURA-MATTAUSCH Hans Jurgen MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/03/01
Vol. E94-C  No. 3  pp. 361-367
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
circuit simulationcompact modelDFMreliability
 Summary | Full Text:PDF(1.3MB)