Shiyuan YANG

A Delay Evaluation Circuit for Analog BIST Function
Zhengliang LV Shiyuan YANG Hong WANG Linda MILOR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/03/01
Vol. E96-C  No. 3  pp. 393-401
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
delay testing, BIST, analog filter, sample-hold circuit, 
 Summary | Full Text:PDF(5.1MB)
Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
Geng HU Hong WANG Shiyuan YANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/08/01
Vol. E91-D  No. 8  pp. 2134-2140
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
mixed-signal circuit, analog, ADC, oscillation, histogram test, 
 Summary | Full Text:PDF(265.2KB)