Shinji MIYANO


Experimental Demonstration of Post-Fabrication Self-Improvement of SRAM Cell Stability by High-Voltage Stress
Toshiro HIRAMOTO Anil KUMAR Takuya SARAYA Shinji MIYANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6  pp. 759-765
Type of Manuscript:  INVITED PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
transistorMOSFETvariabilityoff-state stress
 Summary | Full Text:PDF

NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM
Nurul Ezaila ALIAS Anil KUMAR Takuya SARAYA Shinji MIYANO Toshiro HIRAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 620-623
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
Negative Bias Temperature Instability (NBTI)variabilitySRAMtransistorMOSFET
 Summary | Full Text:PDF

A 40-nm 0.5-V 12.9-pJ/Access 8T SRAM Using Low-Energy Disturb Mitigation Scheme
Shusuke YOSHIMOTO Masaharu TERADA Shunsuke OKUMURA Toshikazu SUZUKI Shinji MIYANO Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 572-578
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
SRAM8Tlow energydisturbhalf selectwrite back
 Summary | Full Text:PDF

Analysis of Operation Margin and Read Speed in 6T- and 8T-SRAM with Local Electron Injected Asymmetric Pass Gate Transistor
Kousuke MIYAJI Kentaro HONDA Shuhei TANAKAMARU Shinji MIYANO Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 564-571
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
6T/8T-SRAMasymmetric pass gate transistorlocal electron injectiondisturb/write marginread speed
 Summary | Full Text:PDF