Shin-ichi OHKAWA


Comprehensive Matching Characterization of Analog CMOS Circuits
Hiroo MASUDA Takeshi KIDA Shin-ichi OHKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4  pp. 966-975
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
mismatchsmall signal parameterCMOS circuitanalog
 Summary | Full Text:PDF(2MB)

A Novel Expression of Spatial Correlation by a Random Curved Surface Model and Its Application to LSI Design
Shin-ichi OHKAWA Hiroo MASUDA Yasuaki INOUE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/04/01
Vol. E91-A  No. 4  pp. 1062-1070
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 20th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
LSI designdevice variationrandom curved surfaceGaussiansystematic part
 Summary | Full Text:PDF(2.3MB)

Concise Modeling of Transistor Variations in an LSI Chip and Its Application to SRAM Cell Sensitivity Analysis
Masakazu AOKI Shin-ichi OHKAWA Hiroo MASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4  pp. 647-654
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
modeling transistor variationswithin-die variationstatistical analysis for transistor parametersSRAM cell sensitivity analysisprocess window for SRAM cell operation
 Summary | Full Text:PDF(2.3MB)

Design Guidelines and Process Quality Improvement for Treatment of Device Variations in an LSI Chip
Masakazu AOKI Shin-ichi OHKAWA Hiroo MASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 788-795
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
within-die parameter variationrandom variationsystematic variationcorrelation lengthfitting function
 Summary | Full Text:PDF(2.1MB)